VEGA SEM


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The VEGA series was designed with respect to a wide range of SEM applications and needs in today’s research and industry.




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MIRA FEG-SEM


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This new generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance...


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LYRA FIB-FESEM


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The LYRA3 FEG is a favorable combination of SEM and FIB for demanding users. It is based on a high resolution Schottky FEG-SEM column and a high performance FIB column.


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TIMA


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The TESCAN Integrated Mineral Analyzer (TIMA) is a new SEM-based automated mineralogy solution for the mining and minerals processing industries


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FERA


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The world’s first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to...


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MAIA


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MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The resolution performance at 1 kV is 1.6...


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Q-PHASE


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TESCAN proudly introduces the Q-PHASE, a multimodal holographic microscope (MHM).  With this instrument TESCAN expands into the field of advanced light microscopy. The Q-PHASE is...


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XEIA


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New UHR SEM/i-FIB workstation Whether your applications demand extremely powerful and ultra-fast micro-/nano- FIB machining, an outstanding image resolution at low beam energies,...


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GAIA


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TESCAN GAIA3 brings together an ultra-high resolution electron column and high-performance ion column fitted onto a single chamber. Built on the proven (MAIA3) FE-SEM platform...


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SEMs


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Buying a used SEM reconditioned by the SEM manufacturer is a safe way to get a reliable working SEM for a nice price.



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Special products


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Using the modern designing and manufacturing systems we are flexible and open to develop and manufacture  custom modifications or special custom systems.


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Software


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TESCAN Software TESCAN produces a number of software solutions. The sophisticated control software is a standard part of every scanning electron microscope produced by TESCAN....


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Accessories


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The creation of favorable conditions for the complex analysis of specimens, together with the possibility of high-quality images of the specimen surface for morphological studies...


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